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Plenary Presentations

Working Group 1 - Terminology

Working Group 2 - Dependability Techniques

Working Group 3 - Dependability Management and Systems

Working Group 4 - Dependability Information Systems


Published Papers


Important Note


Plenary Presentations                                                                    News at Milan Italy, Nov. 2018

Commemorative copies of two standards published by IEC/TC 56 in 2018 were presented to Yoshiki Kinoshita of Japan for the first edition of IEC 62853 Open systems and to Lesley Walls of Great Britain for the third edition of IEC 60812 Failure modes and effects analysis (FMEA and FMECA) by the Chair of TC 56, Tom Van Hardeveld.

Congratulations were given by the Chair of TC 56, Tom Van Hardeveld to Yoshiki Kinoshita of Japan (pictured right) and Gerald Taranto of Great Britain (pictured left) for achieving the IEC 1906 Award. This award recognizes exceptional and recent achievements and contribution to the work of the Technical Committee.


WG1 - Terminology                                                                   News at Milan Italy, November 2018

A meeting of WG1 was held on 7 November 2018 in conjunction with TC56 Fall meeting at the Comitato Elettrotecnico Italiano in Milan, Italy.

Six members of WG1 were present, including one new member from Canada. Many words and terms referred to WG1 by a wide range of TC56 members were discussed with a view to their possible inclusion in the "living document" initially created in 2015. Subject to agreement with TC56 and TC1 it is planned to issue a formal interim document to be read in conjunction with the current published IEC 60050-192. It is anticipated that this may be achieved shortly after the next WG1 meeting to be held in Frankfurt, Germany in the first week of June 2019.


WG2 - Dependability techniques                                                 News at Milan,Italy, November 2018

WG2 have just had a successful meeting in Milan, Italy, between 5th and 9th November 2018

1.  WG2 have had the following standard published;

a)  IEC 60812  Analysis techniques for system reliability - Procedure for failure mode and effects analysis (FMEA).

2.  WG2 are currently working on the following documents:

a)  IEC 60300-3-5   Application guide ‑ Test Conditions and Statistical Test Principles.

b)  IEC 61163-2   Reliability stress screening - Part 2: Electronic components.

c)  IEC 60300-3-1  Dependability management ‑ Part 3-1: Application guide ‑ Analysis techniques for dependability ‑ Guide on methodology.

d)  IEC 61025 Ed. 2.0   Fault tree analysis (FTA).

e)  IEC 61123 Reliability testing ‑ Compliance test plans for success ratio.

f)  IEC 61124 Reliability testing ‑ Compliance tests for constant failure rate and constant failure intensity.

g)  IEC 62506   Methods for product accelerated testing.

h)  IEC 61014   Reliability Growth.

The next meeting of Working Group 2 will take place October 2018.
Please contact the convener for full details.


WG 3 - Dependability management and systems                         News at Milan Italy, November 2018

The November 2018 meeting of WG3 was held in Milan during the week of November 5th

From the meeting the following items of interest are:

1.  IEC 62960 Dependability reviews through the lifecycle: the draft CDV was finalised and will be issued during December. The document is to replace IEC 61160 Design reviews and focusses on technical reviews through the   life cycle

2.  IEC 62402 Obsolescence management: comments on the CDV were discussed and an FDIS is to be issued

3.  IEC 62508 Human aspects of dependability: a new project leader was approved and a fresh call for experts is to be issued with the aim of restarting this project at the next meeting

4.   The five core standards of TC 56 namely 60300-1; Dependability management, 60300-3-4, Specification of dependability requirements; 60300-3-1, Reliability; 60300-3-10, Maintainability; and 60300-3-14, Supportability are being developed together. Draft documents are to be ready for comment by members of all project teams in January with comments discussed at the next meeting of WG3 in Frankfurt in June 2019. The intent is to issue CD’s (or in the case of 60300-3-4 a CDV) after the Frankfurt meeting.


WG 4 - Dependability information systems                               News at Tokyo Japan October, 2017

1.   Thomas Young Olesen was appointed as a vice convener of WG4 at the plenary meeting of TC56.

2.   PT 4.8 discussed dispositions of comments to CDV of IEC 62853/Ed1 and decided proceed to AFDIS.

3.   It was decided that a technical Report on Systems Concepts and Dependability of Systems will be published, based on earlier draft of IEC 62853.

4.   It was agreed that WG4 will seek work on dependability of Internet of Things (IoT), systems of systems (SoS) and IT security. For that purpose, it will study work of ISO/IEC JTC 1/SC 27, ISO/IEC JTC 1/SC 7 and ISO/IEC JTC 1/SC 27.

5.   Next interim meeting is to be held 2018-04-23 ‑ 2018-04-27 in Waterloo University, Canada.


Published Papers

1.   Achieving dependability value for pipelines and facilities.                                                                                                           Click    HERE   to download this pdf file

2.  International Standards on Maintainability and Supportability and Their Application to the Nuclear Industry.                         Click    HERE   to download this pdf file

3.   The 6th Workshop on Open Systems Dependability (WOSD) took place in Tokyo, Japan during October 2017.           The website is available HERE
       Individual slides and papers can be accessed from the website. Individual papers are also listed below;
        a)   Assurance of open systems dependability: developing a framework for automotive security and safety
        b)   ISO 31010 Risk assessment techniques and open systems.
        c)   Developments in Dependability Standardization
        d)   Asset Management, Open Systems and the Role of Governance.
        e)   An overview of IEC 62853 Open systems dependability (CDV).
        f)   Short History of IEC TC56 from 1965 to 2017
        g)   Impact of open systems dependability on IoT and SoS.
        h)   Automated Integration of Potentially Hazardous Open Systems.
        i)   Open Systems Dependability and DEOS: Concept, Retrospect and Prospects


Important Note  

The views expressed in these papers are those of the authors and not necessarily those of IEC/TC 56 or the International Electrotechnical Commission.


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