WG2 have just had a successful meeting in Tokyo, Japan, between 16th and 20th October 2017
1. WG2 have had the following standard published;
a) IEC 61709 Electronic component reliability ‑
Reference conditions for failure rates and stress models for conversion.
2. WG2 are currently working on the following documents:
a) IEC 60300-3-5 Application guide ‑ Test Conditions
and Statistical Test Principles.
b) IEC 60812 Analysis techniques for system reliability
- Procedure for failure mode and effects analysis (FMEA).
There will be a CDV shortly.
c) IEC 61163-2 Reliability stress screening - Part 2: Electronic components.
d) IEC 60300-3-1 Dependability management ‑ Part 3-1:
Application guide ‑ Analysis techniques for dependability ‑
Guide on methodology.
e) IEC 61025 Ed. 2.0 Fault tree analysis (FTA).
f) IEC 61123 Reliability testing ‑ Compliance test plans for success ratio.
g) IEC 61124 Reliability testing ‑ Compliance tests for constant failure rate and constant failure intensity.
h) IEC 62506 Methods for product accelerated testing.
i) IEC 61014 Reliability Growth.
3. WG2 are about to start work updating:
a) IEC 61025 Ed. 2.0 Fault tree analysis (FTA)
b) IEC 61123 Reliability testing ‑ Compliance test plans for success ratio
c) IEC 61124 Reliability testing - Compliance tests for constant failure rate and constant failure intensity.
4. WG2 are considering updating the following documents.
If anyone has any comments on these please contact the
a) IEC 62308: Equipment reliability - Reliability assessment methods
b) IEC 62502 1st Ed. Analysis techniques for dependability ‑ Event tree analysis (ETA)
c) IEC 60605-4 Equipment reliability testing - Part 4: Statistical procedures for exponential distribution - Point
estimates, confidence intervals, prediction intervals and tolerance intervals
d) IEC 60605-6 Equipment reliability testing - Part 6: Tests for
the validity and estimation of the constant failure rate and
constant failure intensity
e) IEC 61163-1 Reliability stress screening - Part 1:
Repairable assemblies manufactured in lots
f) IEC 61165 Application of Markov techniques
g) IEC 61649 Weibull analysis
h) IEC 61710 Power law model - Goodness-of-fit tests
and estimation methods
i) IEC 62506 Methods for product accelerated testing
j) IEC 62551 Analysis techniques for dependability -
Petri net techniques.
The next meeting of Working Group 2 will take place
October 2017 but some project teams may meet during the RAMS
conference in the spring.
Please contact the convener for